RE46C180
DS22275A-page 18
?2011 Microchip Technology Inc.
TM6 HUSH Sen Set
7
SmkCompEnB
T3EnB
V
DD
CalClk
ReadReg
V
SEN
SmkCompOut
Note 5
TM7 PTT/Chamber Test
Set
8
SmkCompEnB
T3EnB
V
DD
CalClk
ReadReg
V
SEN
SmkCompOut
Note 5
TM8 Program Calibration
9
Not Used
V
DD
Not Used
ProgEn
Not Used
Not Used
TM9
Not Used
10
TM10 Serial Read/Write
Calibration
11
ProgData
V
DD
ProgClk
ProgEn
Not Used
Not Used
TM11
Not Used
12
TM12 Standby Sen Check
13
SmkCompEnB
T3EnB
V
DD
Not Used
Not Used
V
SEN
SmkCompOut
Note 5
TM13 Hyst Sen Check
14
SmkCompEnB
T3EnB
V
DD
Not Used
Not Used
V
SEN
SmkCompOut
Note 5
TM14 HUSH Sen Check
15
SmkCompEnB
T3EnB
V
DD
Not Used
Not Used
V
SEN
SmkCompOut
Note 5
TM15 PTT/Chamber Test
CHAMBER Voltage
Check
16
SmkCompEnB
T3EnB
V
DD
Not Used
Not Used
V
SEN
SmkCompOut
Note 5
TM16
Not Used
17
TM17 LB Test
18
Not Used
V
DD
Not Used
LB Test En
RLED En
Not Used LBCompOut
Note 6
TM18 Serial Read/Write
Feature and
Calibration
19
ProgData
V
DD
ProgClk
ProgEn
Not Used
Serial Out
TM19 User EE Lock Bit
20
LockSetEn
V
DD
Not used
ProgEn
Not Used
Lock Out
TABLE 4-7:
TEST MODE FUNCTIONS (CONTINUED)
Mode
Descriptions
T2
Clock
TEST
T2
FEED
IO
T3
TESTOUT
Note 1: After power-up, the unit is in M0, the normal operation mode. When in M0, if T2 is driven to V
DD
, the unit
will enter TM0.
2: In M0 and TM0, the digital output TESTOUT is driven by the internal IO dump signal.
3: In TM3, if TEST = V
SS
, the horn is turned on. IO is in weak pull-down; If TEST = V
DD
, the horn is off. FEED
controls IO and HB/HS.
4: Valid when TEST = V
DD
;
5: SmkCompOut digital comparator output (high if DETECT < V
SEN
; low if DETECT > V
SEN
).
6: LBCompOut digital comparator output (high if V
DD
< LB trip point; low if V
DD
> LB trip point).
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